Junko KOMORI


Characterization of Extrinsic Oxide Breakdown on Thin Dielectric Oxide
Katsuya SHIGA Junko KOMORI Masafumi KATSUMATA Akinobu TERAMOTO Yoji MASHIKO 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1999/04/25
Vol. E82-C  No. 4  pp. 589-592
Type of Manuscript:  Special Section PAPER (Special Issue on Microelectronic Test Structures)
Category: 
Keyword: 
oxide reliabilityextrinsic oxide breakdownTDDBthin oxideactivation energy
 Summary | Full Text:PDF(484.2KB)

Hot Carrier Evaluation of TFT by Emission Microscopy
Junko KOMORI Jun-ichi MITSUHASHI Shigenobu MAEDA 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1994/03/25
Vol. E77-C  No. 3  pp. 367-372
Type of Manuscript:  Special Section PAPER (Special Issue on Quarter Micron Si Device and Process Technologies)
Category: Device Technology
Keyword: 
hot carrierthin film transistor (TFT)emission microscopyplasma hydrogenation
 Summary | Full Text:PDF(614.2KB)