Junichi HIRASE


Verification of Moore's Law Using Actual Semiconductor Production Data
Junichi HIRASE 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2014/06/01
Vol. E97-C  No. 6  pp. 599-608
Type of Manuscript:  PAPER
Category: Semiconductor Materials and Devices
Keyword: 
Moore's laweconomically optimum production costtechnology nodetransistor scaling lawrent's rule
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Introduction of Yield Quadrant and Yield Capability Index for VLSI Manufacturing
Junichi HIRASE 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2014/06/01
Vol. E97-C  No. 6  pp. 609-618
Type of Manuscript:  PAPER
Category: Semiconductor Materials and Devices
Keyword: 
yieldcluster parametersystematic yieldyield quadrantyield capability index
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The Effect of CMOS VLSI IDDq Measurement on Defect Level
Junichi HIRASE Masanori HAMADA 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 1995/07/25
Vol. E78-D  No. 7  pp. 839-844
Type of Manuscript:  Special Section PAPER (Special Issue on Verification, Test and Diagnosis of VLSI Systems)
Category: 
Keyword: 
IDDq testCMOS VLSIfault coveragedefect leveltoggle ratestuck-at faultdesign for testability
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