Jungsun KIM

Experimental Characterization and Modeling of Transmission Line Effects for High-Speed VLSI Circuit Interconnects
Woojin JIN Seongtae YOON Yungseon EO Jungsun KIM 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2000/05/25
Vol. E83-C  No. 5  pp. 728-735
Type of Manuscript:  Special Section PAPER (Special Issue on Recent Developments in Guided-Wave Problems)
IC interconnectsVLSI circuitssilicon substrates-parametersproximity effect
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