Jun SATOH


Optical Beam Induced Current Technique as a Failure Analysis Tool of EPROMs
Jun SATOH Hiroshi NAMBA Tadashi KIKUCHI Kenichi YAMADA Hidetoshi YOSHIOKA Miki TANAKA Ken SHONO 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1994/04/25
Vol. E77-C  No. 4  pp. 574-578
Type of Manuscript:  Special Section PAPER (Special Issue on LSI Failure Analysis)
Category: 
Keyword: 
data retention failureEMSEPROMfailure analysisOBIC
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