Jin-Ho AHN


Noise-Tolerant DAC BIST Scheme Using Integral Calculus Approach
Hyeonuk SON Incheol KIM Sang-Goog LEE Jin-Ho AHN Jeong-Do KIM Sungho KANG 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2011/08/01
Vol. E94-C  No. 8  pp. 1344-1347
Type of Manuscript:  LETTER
Category: Electronic Circuits
Keyword: 
digital-to-analogue converter (DAC)built-in self-test (BIST)noise-immunitystatic testing
 Summary | Full Text:PDF(573.2KB)

A Hardware-Efficient Pattern Matching Architecture Using Process Element Tree for Deep Packet Inspection
Seongyong AHN Hyejeong HONG HyunJin KIM Jin-Ho AHN Dongmyong BAEK Sungho KANG 
Publication:   IEICE TRANSACTIONS on Communications
Publication Date: 2010/09/01
Vol. E93-B  No. 9  pp. 2440-2442
Type of Manuscript:  LETTER
Category: Network Management/Operation
Keyword: 
network intrusion detection systemdeep packet inspectionpattern matchingbrute-force algorithm
 Summary | Full Text:PDF(123.3KB)

A Memory-Efficient Pattern Matching with Hardware-Based Bit-Split String Matchers for Deep Packet Inspection
HyunJin KIM Hong-Sik KIM Jung-Hee LEE Jin-Ho AHN Sungho KANG 
Publication:   IEICE TRANSACTIONS on Communications
Publication Date: 2010/02/01
Vol. E93-B  No. 2  pp. 396-398
Type of Manuscript:  LETTER
Category: Network Management/Operation
Keyword: 
computer network securitydeep packet inspectionfinite state machinepattern matchingand network monitoring
 Summary | Full Text:PDF(269KB)

MTR-Fill: A Simulated Annealing-Based X-Filling Technique to Reduce Test Power Dissipation for Scan-Based Designs
Dong-Sup SONG Jin-Ho AHN Tae-Jin KIM Sungho KANG 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2008/04/01
Vol. E91-D  No. 4  pp. 1197-1200
Type of Manuscript:  LETTER
Category: Dependable Computing
Keyword: 
low power testscan-based testX-fillingtest application time
 Summary | Full Text:PDF(538.3KB)