Jin-Ho AHN

Noise-Tolerant DAC BIST Scheme Using Integral Calculus Approach
Hyeonuk SON Incheol KIM Sang-Goog LEE Jin-Ho AHN Jeong-Do KIM Sungho KANG 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2011/08/01
Vol. E94-C  No. 8  pp. 1344-1347
Type of Manuscript:  LETTER
Category: Electronic Circuits
Keyword: 
digital-to-analogue converter (DAC), built-in self-test (BIST), noise-immunity, static testing, 
 Summary | Full Text:PDF(573.2KB)
A Hardware-Efficient Pattern Matching Architecture Using Process Element Tree for Deep Packet Inspection
Seongyong AHN Hyejeong HONG HyunJin KIM Jin-Ho AHN Dongmyong BAEK Sungho KANG 
Publication:   IEICE TRANSACTIONS on Communications
Publication Date: 2010/09/01
Vol. E93-B  No. 9  pp. 2440-2442
Type of Manuscript:  LETTER
Category: Network Management/Operation
Keyword: 
network intrusion detection system, deep packet inspection, pattern matching, brute-force algorithm, 
 Summary | Full Text:PDF(123.3KB)
A Memory-Efficient Pattern Matching with Hardware-Based Bit-Split String Matchers for Deep Packet Inspection
HyunJin KIM Hong-Sik KIM Jung-Hee LEE Jin-Ho AHN Sungho KANG 
Publication:   IEICE TRANSACTIONS on Communications
Publication Date: 2010/02/01
Vol. E93-B  No. 2  pp. 396-398
Type of Manuscript:  LETTER
Category: Network Management/Operation
Keyword: 
computer network security, deep packet inspection, finite state machine, pattern matching, and network monitoring, 
 Summary | Full Text:PDF(269KB)
MTR-Fill: A Simulated Annealing-Based X-Filling Technique to Reduce Test Power Dissipation for Scan-Based Designs
Dong-Sup SONG Jin-Ho AHN Tae-Jin KIM Sungho KANG 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2008/04/01
Vol. E91-D  No. 4  pp. 1197-1200
Type of Manuscript:  LETTER
Category: Dependable Computing
Keyword: 
low power test, scan-based test, X-filling, test application time, 
 Summary | Full Text:PDF(538.3KB)