Jin-Fu LI


A Low-Power Mixed-Architecture ADC with Time-Interleaved Correlated Double Sampling Technique and Power-Efficient Back-End Stages
Jin-Fu LIN Soon-Jyh CHANG 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2011/01/01
Vol. E94-C  No. 1  pp. 89-101
Type of Manuscript:  PAPER
Category: Electronic Circuits
Keyword: 
analog-to-digital converter (ADC)data convertercorrelated double sampling (CDS)time-interleavedsuccessive approximation (SA) ADC
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A Multi-Code Compression Scheme for Test Time Reduction of System-on-Chip Designs
Hong-Ming SHIEH Jin-Fu LI 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2008/10/01
Vol. E91-D  No. 10  pp. 2428-2434
Type of Manuscript:  PAPER
Category: Dependable Computing
Keyword: 
system-on-chiptestcompressionmulti-code compressiondecompression
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An Efficient Diagnosis Scheme for RAMs with Simple Functional Faults
Jin-Fu LI Chao-Da HUANG 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2007/12/01
Vol. E90-A  No. 12  pp. 2703-2711
Type of Manuscript:  Special Section PAPER (Special Section on VLSI Design and CAD Algorithms)
Category: Memory Design and Test
Keyword: 
diagnosisrandom access memoriesMarch testbuilt-in self-diagnosiscoupling faults
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Efficient Block-Level Connectivity Verification Algorithms for Embedded Memories
Jin-Fu LI 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2004/12/01
Vol. E87-A  No. 12  pp. 3185-3192
Type of Manuscript:  Special Section PAPER (Special Section on VLSI Design and CAD Algorithms)
Category: Test
Keyword: 
system on chipembedded memoriesverificationsignal misplaced fault
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Diagnosing Binary Content Addressable Memories with Comparison and RAM Faults
Jin-Fu LI 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2004/03/01
Vol. E87-D  No. 3  pp. 601-608
Type of Manuscript:  Special Section PAPER (Special Section on Test and Verification of VLSI)
Category: Memory Testing
Keyword: 
content addressable memoriestestingdiagnosismarch test
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