Jin HE

Modeling of NBTI Stress Induced Hole-Trapping and Interface-State-Generation Mechanisms under a Wide Range of Bias Conditions
Chenyue MA Hans Jürgen MATTAUSCH Masataka MIYAKE Takahiro IIZUKA Kazuya MATSUZAWA Seiichiro YAMAGUCHI Teruhiko HOSHIDA Akinori KINOSHITA Takahiko ARAKAWA Jin HE Mitiko MIURA-MATTAUSCH 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2013/10/01
Vol. E96-C  No. 10  pp. 1339-1347
Type of Manuscript:  PAPER
Category: Electronic Components
Keyword: 
NBTI effect, interface-state, hole-trapping, modeling, 
 Summary | Full Text:PDF
Magnetophotonic Materials and Their Applications
Mitsuteru INOUE Alexander V. BARYSHEV Alexander B. KHANIKAEV Maxim E. DOKUKIN Kwanghyun CHUNG Jin HEO Hiroyuki TAKAGI Hironaga UCHIDA Pang Boey LIM Jooyoung KIM 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2008/10/01
Vol. E91-C  No. 10  pp. 1630-1638
Type of Manuscript:  INVITED PAPER (Special Section on Functional Thin Films for Optical Applications)
Category: 
Keyword: 
magnetophotonic crystals, Faraday rotation, magnetic plasmonic nanostructures, 
 Summary | Full Text:PDF