Publication: IEICE TRANSACTIONS on Electronics
Publication Date: 2011/04/01
Vol. E94-C
No. 4
pp. 487-494
Type of Manuscript:
Special Section PAPER (Special Section on Circuits and Design Techniques for Advanced Large Scale Integration)
Category:
Keyword:
process variability, all digital, on-chip monitor, buffer ring, NBTI, PBTI, |
