Jae Yeong LEE


Automatic Detection of Region-Mura Defect in TFT-LCD
Jae Yeong LEE Suk In YOO 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2004/10/01
Vol. E87-D  No. 10  pp. 2371-2378
Type of Manuscript:  PAPER
Category: Image Processing and Video Processing
Keyword: 
machine visionimage segmentationregression diagnosticsindustrial inspectionvisual perception
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