Isami SAKAI


Device-Deviation Tolerant Elastic-Vt CMOS Circuits with Fine-Grain Power Control Capability
Masayuki MIZUNO Hitoshi ABIKO Koichiro FURUTA Isami SAKAI Masakazu YAMASHINA 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1998/09/25
Vol. E81-C  No. 9  pp. 1463-1472
Type of Manuscript:  Special Section PAPER (Special Issue on Novel VLSI Processor Architectures)
Category: 
Keyword: 
low-threshold voltageleakage currentsupply-voltage fluctuationsupply-voltage controllow power dissipation
 Summary | Full Text:PDF

Boron Penetration and Hot-Carrier Effects in Surface-Channel PMOSFETs with p+ Poly-Si Gates
Tohru MOGAMI Lars E. G. JOHANSSON Isami SAKAI Masao FUKUMA 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1995/03/25
Vol. E78-C  No. 3  pp. 255-260
Type of Manuscript:  Special Section PAPER (Special Issue on Sub-1/4 Micron Device and Process Technologies)
Category: 
Keyword: 
hot-carrier effectsboron penetrationsurface-channel PMOSFETsgate currentBF2
 Summary | Full Text:PDF