Ikuo KURACHI


Advanced Characterization Method for Sub-Micron DRAM Cell Transistors
Ikuo KURACHI 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1999/04/25
Vol. E82-C  No. 4  pp. 618-623
Type of Manuscript:  Special Section PAPER (Special Issue on Microelectronic Test Structures)
Category: 
Keyword: 
DRAMcell transistorstest structureparameter extractionparasitic resistance
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Improvement of "Soft Breakdown" Leakage of off-State nMOSFETs Induced by HBM ESD Events Using Drain Engineering for LDD Structure
Ikuo KURACHI Yasuhiro FUKUDA 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 1994/01/25
Vol. E77-A  No. 1  pp. 166-173
Type of Manuscript:  Special Section PAPER (Special Section on Reliability)
Category: Failure Physics and Failure Analysis
Keyword: 
LDD MOSFETsESD,off-state leakage,band-to-band tunneling,interface state-to-band tunnelingdrain engineering
 Summary | Full Text:PDF