Ickhyun SONG


Application of the Compact Channel Thermal Noise Model of Short Channel MOSFETs to CMOS RFIC Design
Jongwook JEON Ickhyun SONG Jong Duk LEE Byung-Gook PARK Hyungcheol SHIN 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2009/05/01
Vol. E92-C  No. 5  pp. 627-634
Type of Manuscript:  Special Section PAPER (Special Section on Fundamentals and Applications of Advanced Semiconductor Devices)
Category: 
Keyword: 
CMOSchannel thermal noiseradio frequency integrated circuit (RFIC)low noise amplifier (LNA)noise figure
 Summary | Full Text:PDF

FN Stress Induced Degradation on Random Telegraph Signal Noise in Deep Submicron NMOSFETs
Hochul LEE Youngchang YOON Ickhyun SONG Hyungcheol SHIN 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2008/05/01
Vol. E91-C  No. 5  pp. 776-779
Type of Manuscript:  Special Section LETTER (Special Section on Fundamentals and Applications of Advanced Semiconductor Devices)
Category: 
Keyword: 
random telegraph signal noiseFN stressflash memoryMOSFET
 Summary | Full Text:PDF