Publication: IEICE TRANSACTIONS on Electronics Publication Date: 2012/05/01 Vol. E95-CNo. 5pp. 820-825 Type of Manuscript: Special Section PAPER (Special Section on Fundamentals and Applications of Advanced Semiconductor Devices) Category: Keyword: Tunnel Field-Effect Transistors, threshold voltage, VT-control doping region,
Publication: IEICE TRANSACTIONS on Electronics Publication Date: 2012/05/01 Vol. E95-CNo. 5pp. 826-830 Type of Manuscript: Special Section PAPER (Special Section on Fundamentals and Applications of Advanced Semiconductor Devices) Category: Keyword: vertical-channel TFET, field-coupling effect, source configuration,
Publication: IEICE TRANSACTIONS on Electronics Publication Date: 2012/05/01 Vol. E95-CNo. 5pp. 842-846 Type of Manuscript: Special Section PAPER (Special Section on Fundamentals and Applications of Advanced Semiconductor Devices) Category: Keyword: RRAM, conductive defect, cell thickness, reset current, set voltage, forming voltage, and low power,
Publication: IEICE TRANSACTIONS on Electronics Publication Date: 2012/05/01 Vol. E95-CNo. 5pp. 837-841 Type of Manuscript: Special Section PAPER (Special Section on Fundamentals and Applications of Advanced Semiconductor Devices) Category: Keyword: 3 dimensional NAND flash memory, operation scheme, program inhibition,