Huawei LI

A New Multiple-Round Dimension-Order Routing for Networks-on-Chip
Binzhang FU Yinhe HAN Huawei LI Xiaowei LI 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2011/04/01
Vol. E94-D  No. 4  pp. 809-821
Type of Manuscript:  PAPER
Category: Computer System
Keyword: 
network-on-chip (NoC), fault-tolerant routing, multiple round dimension-order routing, turn model, 
 Summary | Full Text:PDF
Testable Critical Path Selection Considering Process Variation
Xiang FU Huawei LI Xiaowei LI 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2010/01/01
Vol. E93-D  No. 1  pp. 59-67
Type of Manuscript:  PAPER
Category: Dependable Computing
Keyword: 
testable critical path selection, process variation, 
 Summary | Full Text:PDF
Compression/Scan Co-design for Reducing Test Data Volume, Scan-in Power Dissipation, and Test Application Time
Yu HU Yinhe HAN Xiaowei LI Huawei LI Xiaoqing WEN 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2006/10/01
Vol. E89-D  No. 10  pp. 2616-2625
Type of Manuscript:  PAPER
Category: Dependable Computing
Keyword: 
compression, run-length coding, random access scan, power dissipation, test application time, 
 Summary | Full Text:PDF
Wrapper Scan Chains Design for Rapid and Low Power Testing of Embedded Cores
Yinhe HAN Yu HU Xiaowei LI Huawei LI Anshuman CHANDRA Xiaoqing WEN 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2005/09/01
Vol. E88-D  No. 9  pp. 2126-2134
Type of Manuscript:  PAPER
Category: Dependable Computing
Keyword: 
SOC testing, wrapper design, scan slices, overlapping, 
 Summary | Full Text:PDF