| Hiroyuki YAMAUCHI
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Plate Bumping Leakage Current Measurement Method and Its Application to Data Retention Characteristic Analysis for RJB DRAM Cells Toru IWATA Hiroyuki YAMAUCHI | Publication: IEICE TRANSACTIONS on Electronics
Publication Date: 1996/12/25
Vol. E79-C
No. 12
pp. 1707-1712
Type of Manuscript:
Special Section PAPER (Special Issue on Low-Power LSI Technologies) Category: Keyword: DRAM, data retention, memory-cell leakage current, | | Summary | Full Text:PDF | |
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An Asymptotically Zero Power Charge-Recycling Bus Architecture for Battery-Operated Ultrahigh Data Rate ULSI'S Hiroyuki YAMAUCHI Hironori AKAMATSU Tsutomu FUJITA | Publication: IEICE TRANSACTIONS on Electronics
Publication Date: 1995/06/25
Vol. E78-C
No. 6
pp. 671-679
Type of Manuscript:
Special Section PAPER (Special Issue on the 1994 VLSI Circuits Symposium (Joint Issue with the IEEE Journal of Solid-State Circuits, Vol. 30, No. 4 April 1995)) Category: Keyword:
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