Hiroshi YOKOYAMA

Improving Random Pattern Testability with Partial Circuit Duplication Approach
Hiroshi YOKOYAMA Xiaoqing WEN Hideo TAMAMOTO 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 1998/07/25
Vol. E81-D  No. 7  pp. 654-659
Type of Manuscript:  Special Section PAPER (Special Issue on Test and Diagnosis of VLSI)
Category: Design for Testability
Keyword: 
partial circuit duplication, random testing, design for testability, built-in self-test, 
 Summary | Full Text:PDF
Efficient Guided-Probe Fault Location Method for Sequential Circuits
Xiaoging WEN Kozo KINOSHITA Hideo TAMAMOTO Hiroshi YOKOYAMA 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 1995/02/25
Vol. E78-D  No. 2  pp. 122-129
Type of Manuscript:  PAPER
Category: Fault Tolerant Computing
Keyword: 
guided-probe fault location, selection of lines to probe, sequential circuit, VLSI diagnosis, 
 Summary | Full Text:PDF
Control of Electronic State in Organic Semiconductor by Substituent Groups
Kazuhiro SAITO Hiroshi YOKOYAMA 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1994/05/25
Vol. E77-C  No. 5  pp. 654-656
Type of Manuscript:  Special Section PAPER (Special Section on Organic Functional Devices)
Category: 
Keyword: 
organic semiconductor, Langmuir-Blodgett films, cyanine dye, photoelectric cells, 
 Summary | Full Text:PDF