Publication: Publication Date: 2019/04/01 Vol. E102-CNo. 4pp. 340-346 Type of Manuscript: INVITED PAPER (Special Section on Progress in Optical Device Technology for Increasing Data Transmission Capacity) Category: Keyword: flip-chip, EA-DFB laser, Mach-Zehnder modulator, packaging,
Publication: Publication Date: 2017/12/01 Vol. E100-ANo. 12pp. 2824-2833 Type of Manuscript: Special Section PAPER (Special Section on VLSI Design and CAD Algorithms) Category: Keyword: transition faults, correlation, capture power reduction, X-filling, SAT,
Publication: IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences Publication Date: 2016/12/01 Vol. E99-ANo. 12pp. 2483-2490 Type of Manuscript: Special Section PAPER (Special Section on VLSI Design and CAD Algorithms) Category: Keyword: low-input voltage, thermoelectric generator, boost converter, oscillator, amplitude regulation,
Publication: IEICE TRANSACTIONS on Information and Systems Publication Date: 2013/09/01 Vol. E96-DNo. 9pp. 1994-2002 Type of Manuscript: Special Section PAPER (Special Section on Dependable Computing) Category: Keyword: X-bit, don't care identification, X-bit distribution, test compaction,
An Analysis of the Relationship between IDDQ Testability and D-Type Flip-Flop Structure Yukiya MIURAHiroshi YAMAZAKI
Publication: IEICE TRANSACTIONS on Information and Systems Publication Date: 1998/10/25 Vol. E81-DNo. 10pp. 1072-1078 Type of Manuscript: PAPER Category: Fault Tolerant Computing Keyword: IDDQ testing, bridging faults, flip-flops, fault analysis,
