Hiroshi TAKAFUJI


Impact of Self-Heating in Wire Interconnection on Timing
Toshiki KANAMOTO Takaaki OKUMURA Katsuhiro FURUKAWA Hiroshi TAKAFUJI Atsushi KUROKAWA Koutaro HACHIYA Tsuyoshi SAKATA Masakazu TANAKA Hidenari NAKASHIMA Hiroo MASUDA Takashi SATO Masanori HASHIMOTO 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2010/03/01
Vol. E93-C  No. 3  pp. 388-392
Type of Manuscript:  BRIEF PAPER
Category: 
Keyword: 
interconnectdelay variationparasitic resistancethermaltemperatureself-heatSoC
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An Approach for Reducing Leakage Current Variation due to Manufacturing Variability
Tsuyoshi SAKATA Takaaki OKUMURA Atsushi KUROKAWA Hidenari NAKASHIMA Hiroo MASUDA Takashi SATO Masanori HASHIMOTO Koutaro HACHIYA Katsuhiro FURUKAWA Masakazu TANAKA Hiroshi TAKAFUJI Toshiki KANAMOTO 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2009/12/01
Vol. E92-A  No. 12  pp. 3016-3023
Type of Manuscript:  Special Section PAPER (Special Section on VLSI Design and CAD Algorithms)
Category: Device and Circuit Modeling and Analysis
Keyword: 
low powerleakagegate delay modelvariation
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Improvement in Computational Accuracy of Output Transition Time Variation Considering Threshold Voltage Variations
Takaaki OKUMURA Atsushi KUROKAWA Hiroo MASUDA Toshiki KANAMOTO Masanori HASHIMOTO Hiroshi TAKAFUJI Hidenari NAKASHIMA Nobuto ONO Tsuyoshi SAKATA Takashi SATO 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2009/04/01
Vol. E92-A  No. 4  pp. 990-997
Type of Manuscript:  Special Section PAPER (Special Section on Advanced Technologies Emerging Mainly from the 21st Workshop on Circuits and Systems in Karuizawa)
Category: 
Keyword: 
SSTAoutputtransition timegate delay modelprocess variation
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