Hiroshi SHIMOMURA


Equivalent Noise Temperature Representation for Scaled MOSFETs
Hiroshi SHIMOMURA Kuniyuki KAKUSHIMA Hiroshi IWAI 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2010/10/01
Vol. E93-C  No. 10  pp. 1550-1552
Type of Manuscript:  LETTER
Category: Semiconductor Materials and Devices
Keyword: 
MOSFETsthermal noiseequivalent noise temperature
 Summary | Full Text:PDF

Effect of High Frequency Noise Current Sources on Noise Figure for Sub-50 nm Node MOSFETs
Hiroshi SHIMOMURA Kuniyuki KAKUSHIMA Hiroshi IWAI 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2010/05/01
Vol. E93-C  No. 5  pp. 678-684
Type of Manuscript:  PAPER
Category: Semiconductor Materials and Devices
Keyword: 
MOSFETsthermal noisenoise figurenoise parameters
 Summary | Full Text:PDF