Publication: IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences Publication Date: 2006/02/01 Vol. E89-ANo. 2pp. 465-468 Type of Manuscript: Special Section LETTER (Special Section on Analog Circuit Techniques and Related Topics) Category: Keyword: LSI testing, analog circuit, BIST, equivalent-time sampling, sampler,
Publication: IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences Publication Date: 2003/02/01 Vol. E86-ANo. 2pp. 504-508 Type of Manuscript: LETTER Category: Analog Signal Processing Keyword: ADC, nonlinearity, digital error correction, digital signal processing, LSI tester,