Hiroshi MOTOKI

A New Autofocus Using Image Processing Techniques in Critical Dimension Measurement SEM
Fumio KOMATSU Hiroshi MOTOKI Motosuke MIYOSHI 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 1998/07/25
Vol. E81-D  No. 7  pp. 738-742
Type of Manuscript:  Special Section PAPER (Special Issue on Test and Diagnosis of VLSI)
Category: Beam Testing/Diagnosis
autofocusimage processingpattern recognitionZ-sensorCD SEM
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