Hirobumi KAWASHIMA


Simulation Technique of Heating by Contact Resistance for ESD Protection Device
Kazuya MATSUZAWA Hirobumi KAWASHIMA Toyoaki MATSUHASHI Naoyuki SHIGYO 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2003/03/01
Vol. E86-C  No. 3  pp. 404-408
Type of Manuscript:  Special Section PAPER (Special Issue on the 2002 IEEE International Conference on Simulation of Semiconductor Processes and Devices (SISPAD'02))
Category: 
Keyword: 
ESDcontact resistancesimulationheating
 Summary | Full Text:PDF

Non-Isothermal Device Simulation of Gate Switching and Drain Breakdown Characteristics of Si MOSFET in Transient State
Hirobumi KAWASHIMA Ryo DANG (or DAN) 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1999/06/25
Vol. E82-C  No. 6  pp. 894-899
Type of Manuscript:  Special Section PAPER (Special Issue on TCAD for Semiconductor Industries)
Category: 
Keyword: 
device simulationnon-isothermalSi MOSFETtransient statebreakdown
 Summary | Full Text:PDF

Non-isothermal Device Simulation Taking Account of Transistor Self-Heating and In-Chip Thermal Interdependence
Hirobumi KAWASHIMA Ryo DANG 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 1997/10/25
Vol. E80-A  No. 10  pp. 1973-1978
Type of Manuscript:  Special Section PAPER (Special Section on VLSI Design and CAD Algorithms)
Category: 
Keyword: 
device simulationnon-isothermalheat flowself-heatingSi MOSFETnegative resistance
 Summary | Full Text:PDF