Hiroaki KONOURA


Reliability-Configurable Mixed-Grained Reconfigurable Array Supporting C-Based Design and Its Irradiation Testing
Hiroaki KONOURA Dawood ALNAJJAR Yukio MITSUYAMA Hajime SHIMADA Kazutoshi KOBAYASHI Hiroyuki KANBARA Hiroyuki OCHI Takashi IMAGAWA Kazutoshi WAKABAYASHI Masanori HASHIMOTO Takao ONOYE Hidetoshi ONODERA 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2014/12/01
Vol. E97-A  No. 12  pp. 2518-2529
Type of Manuscript:  Special Section PAPER (Special Section on VLSI Design and CAD Algorithms)
Category: High-Level Synthesis and System-Level Design
Keyword: 
reconfigurable architecturesoft errorradiation testbehavioral synthesisstate machine
 Summary | Full Text:PDF

Comparative Evaluation of Lifetime Enhancement with Fault Avoidance on Dynamically Reconfigurable Devices
Hiroaki KONOURA Takashi IMAGAWA Yukio MITSUYAMA Masanori HASHIMOTO Takao ONOYE 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2014/07/01
Vol. E97-A  No. 7  pp. 1468-1482
Type of Manuscript:  Special Section PAPER (Special Section on Design Methodologies for System on a Chip)
Category: 
Keyword: 
fault avoidancelifetime enhancementmean-time-to-failure (MTTF)partial reconfiguration
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NBTI Mitigation Method by Inputting Random Scan-In Vectors in Standby Time
Hiroaki KONOURA Toshihiro KAMEDA Yukio MITSUYAMA Masanori HASHIMOTO Takao ONOYE 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2014/07/01
Vol. E97-A  No. 7  pp. 1483-1491
Type of Manuscript:  Special Section PAPER (Special Section on Design Methodologies for System on a Chip)
Category: 
Keyword: 
NBTINBTI mitigationperformance degradationscan pathagingreliability
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Field Slack Assessment for Predictive Fault Avoidance on Coarse-Grained Reconfigurable Devices
Toshihiro KAMEDA Hiroaki KONOURA Dawood ALNAJJAR Yukio MITSUYAMA Masanori HASHIMOTO Takao ONOYE 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2013/08/01
Vol. E96-D  No. 8  pp. 1624-1631
Type of Manuscript:  Special Section PAPER (Special Section on Reconfigurable Systems)
Category: Test and Verification
Keyword: 
field testfault avoidancecoarse-grained reconfigurable device
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Stress Probability Computation for Estimating NBTI-Induced Delay Degradation
Hiroaki KONOURA Yukio MITSUYAMA Masanori HASHIMOTO Takao ONOYE 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2011/12/01
Vol. E94-A  No. 12  pp. 2545-2553
Type of Manuscript:  Special Section PAPER (Special Section on VLSI Design and CAD Algorithms)
Category: Device and Circuit Modeling and Analysis
Keyword: 
NBTIstress probabilitytiming analysis
 Summary | Full Text:PDF