Hiroaki HAZAMA


FOREWORD
Hiroaki HAZAMA 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2002/05/01
Vol. E85-C  No. 5  pp. 1124-1124
Type of Manuscript:  FOREWORD
Category: 
Keyword: 
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A Novel Threshold Voltage Distribution Measuring Technique for Flash EEPROM Devices
Toshihiko HIMENO Naohiro MATSUKAWA Hiroaki HAZAMA Koji SAKUI Masamitsu OSHIKIRI Kazunori MASUDA Kazushige KANDA Yasuo ITOH Jin-ichi MIYAMOTO 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1996/02/25
Vol. E79-C  No. 2  pp. 145-151
Type of Manuscript:  Special Section PAPER (Special Issue on Microelectronic Test Structures)
Category: Device and Circuit Characterization
Keyword: 
flash memoryVth distributionreliabilityNAND flashnonvolatile memory
 Summary | Full Text:PDF(806.8KB)

Electrical Properties and Technological Perspectives of Thin-Film SOI MOSFETs
Makoto YOSHIMI Minoru TAKAHASHI Shigeru KAMBAYASHI Masato KEMMOCHI Hiroaki HAZAMA Tetsunori WADA Koichi KATO Hiroyuki TANGO Kenji NATORI 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1991/02/25
Vol. E74-C  No. 2  pp. 337-351
Type of Manuscript:  INVITED PAPER
Category: 
Keyword: 
 Summary | Full Text:PDF(1.4MB)