IEICE Trans

Hideyuki IWATA

Expansion of Optical Access Network to Rural Area Hideyuki IWATA Yuji INOUE
Publication: Publication Date: 2018/04/01 Vol. E101-B No. 4 pp. 966-971 Type of Manuscript: INVITED PAPER (Special Section on Optical Access System for Social Life) Category: Keyword: optical access network, FTTH, GE-PON, solution,
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Current-Voltage Hysteresis Characteristics in MOS Capacitors with Si-Implanted Oxide Toshihiro MATSUDA Shinsuke ISHIMARU Shingo NOHARA Hideyuki IWATA Kiyotaka KOMOKU Takayuki MORISHITA Takashi OHZONE
Publication: IEICE TRANSACTIONS on Electronics Publication Date: 2009/12/01 Vol. E92-C No. 12 pp. 1523-1530 Type of Manuscript: PAPER Category: Semiconductor Materials and Devices Keyword: MOS capacitors, Si-implantation, thermal oxide, I-V hysteresis, hysteresis window, nonvolatile memory,
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A Test Structure for Asymmetry and Orientation Dependence Analysis of CMOSFETs Toshihiro MATSUDA Yuya SUGIYAMA Keita NOHARA Kazuhiro MORITA Hideyuki IWATA Takashi OHZONE Takayuki MORISHITA Kiyotaka KOMOKU
Publication: IEICE TRANSACTIONS on Electronics Publication Date: 2008/08/01 Vol. E91-C No. 8 pp. 1331-1337 Type of Manuscript: Special Section PAPER (Special Section on Microelectronic Test Structures (ICMTS2007)) Category: Keyword: CMOS, symmetry, orientation dependence, drain current, substrate current,
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A CMOS Temperature Sensor Circuit Takashi OHZONE Tatsuaki SADAMOTO Takayuki MORISHITA Kiyotaka KOMOKU Toshihiro MATSUDA Hideyuki IWATA
Publication: IEICE TRANSACTIONS on Electronics Publication Date: 2007/04/01 Vol. E90-C No. 4 pp. 895-902 Type of Manuscript: PAPER Category: Integrated Electronics Keyword: CMOS, temperature sensor, temperature dependent voltage, subthreshold current,
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A Test Structure to Analyze Electrical CMOSFET Reliabilities between Center and Edge along the Channel Width Takashi OHZONE Eiji ISHII Takayuki MORISHITA Kiyotaka KOMOKU Toshihiro MATSUDA Hideyuki IWATA
Publication: IEICE TRANSACTIONS on Electronics Publication Date: 2007/02/01 Vol. E90-C No. 2 pp. 515-522 Type of Manuscript: PAPER Category: Semiconductor Materials and Devices Keyword: CMOSFET, reliability, LDD-type, channel width, isolation,
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A Test Structure to Analyze Highly-Doped-Drain and Lightly-Doped-Drain in CMOSFET Takashi OHZONE Kazuhiko OKADA Takayuki MORISHITA Kiyotaka KOMOKU Toshihiro MATSUDA Hideyuki IWATA
Publication: IEICE TRANSACTIONS on Electronics Publication Date: 2006/09/01 Vol. E89-C No. 9 pp. 1351-1357 Type of Manuscript: PAPER Category: Semiconductor Materials and Devices Keyword: CMOSFET, LDD-type, source/drain-resistance, sheet resistance,
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A Temperature and Supply Voltage Independent CMOS Voltage Reference Circuit Toshihiro MATSUDA Ryuichi MINAMI Akira KANAMORI Hideyuki IWATA Takashi OHZONE Shinya YAMAMOTO Takashi IHARA Shigeki NAKAJIMA
Publication: IEICE TRANSACTIONS on Electronics Publication Date: 2005/05/01 Vol. E88-C No. 5 pp. 1087-1093 Type of Manuscript: PAPER Category: Integrated Electronics Keyword: CMOS, voltage reference, threshold-voltage, low power,
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A Test Structure for Two-Dimensional Analysis of MOSFETs by Hot-Carrier-Induced Photoemission Toshihiro MATSUDA Hiroaki TAKEUCHI Akira MURAMATSU Hideyuki IWATA Takashi OHZONE Kyoji YAMASHITA Norio KOIKE Ken-ichiro TATSUUMA
Publication: IEICE TRANSACTIONS on Electronics Publication Date: 2005/05/01 Vol. E88-C No. 5 pp. 811-816 Type of Manuscript: Special Section PAPER (Special Section on Microelectronic Test Structures) Category: Keyword: MOSFET, photoemission, hot carrier, gate length,
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Air Blowing Optical Fiber Cable System for Aerial Application Hideyuki IWATA Shigeru TOMITA
Publication: IEICE TRANSACTIONS on Electronics Publication Date: 2003/05/01 Vol. E86-C No. 5 pp. 725-730 Type of Manuscript: Special Section PAPER (Joint Special Issue on Recent Progress in Optoelectronics and Communications) Category: Keyword: access network, optical fiber, optical fiber cable, blowing,
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Visible Electroluminescence from MOS Capacitors with Si-Implanted SiO₂ Toshihiro MATSUDA Masaharu KAWABE Hideyuki IWATA Takashi OHZONE
Publication: IEICE TRANSACTIONS on Electronics Publication Date: 2002/11/01 Vol. E85-C No. 11 pp. 1895-1904 Type of Manuscript: Special Section PAPER (Special Issue on Electronic Displays) Category: EL Displays Keyword: MOS capacitor, electroluminescence, Si-implantation, SiO₂,
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Optical Fiber Cable Design for Economical Installation Hideyuki IWATA Shigeru TOMITA
Publication: IEICE TRANSACTIONS on Electronics Publication Date: 2002/04/01 Vol. E85-C No. 4 pp. 910-914 Type of Manuscript: Special Section PAPER (Special Issue on Optical Fibers and Devices) Category: Keyword: optical fiber, optical fiber cable, FTTH, access networks,
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Pre-Connectorized High Density Optical Fiber Cable Technology Hideyuki IWATA Shigeru TOMITA Shinji NAGASAWA Tadatoshi TANIFUJI
Publication: IEICE TRANSACTIONS on Communications Publication Date: 1997/04/25 Vol. E80-B No. 4 pp. 540-550 Type of Manuscript: Special Section PAPER (Special Issue on Optical Fibers and Their Applications) Category: Keyword: optical fiber, fiber ribbon, optical fiber cable, access network optical connector,
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Temperature Dependence of Single Event Charge Collection in SOI MOSFETs by Simulation Approach Tsukasa OOOKA Hideyuki IWATA Takashi OHZONE
Publication: IEICE TRANSACTIONS on Electronics Publication Date: 1997/03/25 Vol. E80-C No. 3 pp. 417-422 Type of Manuscript: Special Section PAPER (Special Issue on SOI Devices and Their Process Technologies) Category: Keyword: SOI MOSFETs, numerical simulation, temperature dependence, single event upset, soft errors,
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A Two-Dimensional Analysis of Hot-Carrier Photoemission from LOCOS- and Trench-Isolated MOSFETs Takashi OHZONE Hideyuki IWATA Yukiharu URAOKA Shinji ODANAKA
Publication: IEICE TRANSACTIONS on Electronics Publication Date: 1993/11/25 Vol. E76-C No. 11 pp. 1673-1682 Type of Manuscript: PAPER Category: Integrated Electronics Keyword: CMOS, hot-carrier, photoemission, isolation,
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Three-Dimensional Dynamics of Heavy-Ion Induced CMOS Latchup Hideyuki IWATA Mitsuo YASUHIRA Shinji ODANAKA Takashi OHZONE
Publication: IEICE TRANSACTIONS on Electronics Publication Date: 1992/10/25 Vol. E75-C No. 10 pp. 1281-1290 Type of Manuscript: PAPER Category: Semiconductor Materials and Devices Keyword: heavy-ion, CMOS, latchup, simulation,
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