Hideo AKIYA


The Influence of Stud Bumping above the MOSFETs on Device Reliability
Nobuhiro SHIMOYAMA Katsuyuki MACHIDA Masakazu SHIMAYA Hideo AKIYA Hakaru KYURAGI 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2000/05/25
Vol. E83-A  No. 5  pp. 851-856
Type of Manuscript:  Special Section PAPER (Special Section on Reliability Theory and Its Applications)
Category: 
Keyword: 
stud bumpstressinterface trapshot carrierannealing
 Summary | Full Text:PDF(933.4KB)

Propagation Results of the Magnetic Bubble in Dual Conductor Current Access Test Circuits
Hideo AKIYAMA Toshiwo KAWASAKI Taiji TSURUOKA Kazutami KAWAMURA Takaaki MIYASHITA 
Publication:   IEICE TRANSACTIONS (1976-1990)
Publication Date: 1981/10/25
Vol. E64-E  No. 10  pp. 671-672
Type of Manuscript:  LETTER
Category: Other Devices
Keyword: 
 Summary | Full Text:PDF(130.1KB)