Hideki YUKITOMO


A New Conformance Testing Technique for Localization of Multiple Faults in Communication Protocols
Yoshiaki KAKUDA Hideki YUKITOMO Shinji KUSUMOTO Tohru KIKUNO 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 1995/07/25
Vol. E78-D  No. 7  pp. 802-810
Type of Manuscript:  Special Section PAPER (Special Issue on Verification, Test and Diagnosis of VLSI Systems)
Category: 
Keyword: 
software testingcommunication protocolconformance testingfault localizationtest sequence
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