Hideaki MAJIMA

A 0.13 µm CMOS Bluetooth EDR Transceiver with High Sensitivity over Wide Temperature Range and Immunity to Process Variation
Kenichi AGAWA Shinichiro ISHIZUKA Hideaki MAJIMA Hiroyuki KOBAYASHI Masayuki KOIZUMI Takeshi NAGANO Makoto ARAI Yutaka SHIMIZU Asuka MAKI Go URAKAWA Tadashi TERADA Nobuyuki ITOH Mototsugu HAMADA Fumie FUJII Tadamasa KATO Sadayuki YOSHITOMI Nobuaki OTSUKA 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2010/06/01
Vol. E93-C  No. 6  pp. 803-811
Type of Manuscript:  Special Section PAPER (Special Section on Analog Circuits and Related SoC Integration Technologies)
Category: 
Keyword: 
CMOS wireless transceiver, Bluetooth, sensitivity, temperature compensation, phase noise, VCO pulling, MOS switch, leakage current, 
 Summary | Full Text:PDF
A 2.4-GHz Temperature-Compensated CMOS LC-VCO for Low Frequency Drift Low-Power Direct-Modulation GFSK Transmitters
Toru TANZAWA Kenichi AGAWA Hiroyuki SHIBAYAMA Ryota TERAUCHI Katsumi HISANO Hiroki ISHIKURO Shouhei KOUSAI Hiroyuki KOBAYASHI Hideaki MAJIMA Toru TAKAYAMA Masayuki KOIZUMI Fumitoshi HATORI 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2005/04/01
Vol. E88-C  No. 4  pp. 490-495
Type of Manuscript:  Special Section PAPER (Special Section on Low-Power LSI and Low-Power IP)
Category: Analog
Keyword: 
GFSK, CMOS LC-VCO, Bluetooth, direct modulation, low power, 
 Summary | Full Text:PDF
Suppression of Short Channel Effect in Triangular Parallel Wire Channel MOSFETs
Toshiki SAITO Takuya SARAYA Takashi INUKAI Hideaki MAJIMA Toshiharu NAGUMO Toshiro HIRAMOTO 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2002/05/01
Vol. E85-C  No. 5  pp. 1073-1078
Type of Manuscript:  Special Section PAPER (Special Issue on Advanced Sub-0.1 µm CMOS Devices)
Category: 
Keyword: 
SOI MOSFET, triangular wire, short channel effect, subthreshold factor, DIBL, 
 Summary | Full Text:PDF
Single-Electron Circuit Simulation
Shuhei AMAKAWA Hideaki MAJIMA Hironobu FUKUI Minoru FUJISHIMA Koichiro HOH 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1998/01/25
Vol. E81-C  No. 1  pp. 21-29
Type of Manuscript:  Special Section PAPER (Special Issue on Technology Challenges for Single Electron Devices)
Category: 
Keyword: 
Coulomb blockade of tunneling, master equation, Monte Carlo method, SET, SPICE, 
 Summary | Full Text:PDF