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Publication: IEICE TRANSACTIONS on Electronics Publication Date: 2013/05/01 Vol. E96-CNo. 5pp. 624-629 Type of Manuscript: Special Section PAPER (Special Section on Fundamentals and Applications of Advanced Semiconductor Devices) Category: Keyword: fluorine, flicker noise, 1/f noise, reliability, hot-carrier, NBTI, MOSFET,
Publication: IEICE TRANSACTIONS on Electronics Publication Date: 2012/05/01 Vol. E95-CNo. 5pp. 831-836 Type of Manuscript: Special Section PAPER (Special Section on Fundamentals and Applications of Advanced Semiconductor Devices) Category: Keyword: SOHOS, high-k, gate-all-around, program/erase speed, flash memory,
Publication: IEICE TRANSACTIONS on Electronics Publication Date: 2011/05/01 Vol. E94-CNo. 5pp. 712-716 Type of Manuscript: INVITED PAPER (Special Section on Fundamentals and Applications of Advanced Semiconductor Devices) Category: Keyword: high transport, SiGe, orientation, strain, heterostructure,
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