Hanjong YOO

Non-uniform Multi-Layer IC Interconnect Transmission Line Characterization for Fast Signal Transient Simulation of High-Speed/High-Density VLSI Circuits
Woojin JIN Hanjong YOO Yungseon EO 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1999/06/25
Vol. E82-C  No. 6  pp. 955-966
Type of Manuscript:  Special Section PAPER (Special Issue on TCAD for Semiconductor Industries)
interconnectsubstrate effectshielding effectsignal integritysignal delaycrosstalk noise
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