Geng HU


Combined Self-Test of Analog Portion and ADCs in Integrated Mixed-Signal Circuits
Geng HU Hong WANG Shiyuan YANG 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2008/08/01
Vol. E91-D  No. 8  pp. 2134-2140
Type of Manuscript:  PAPER
Category: Dependable Computing
Keyword: 
mixed-signal circuitanalogADCoscillationhistogram test
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