Fumio SASAKI


Characteristics of GaAs HEMTs with Flip-Chip Interconnections
Naoko ONO Fumio SASAKI Kazuhiro ARAI Hiroyuki YOSHINAGA Yuji ISEKI 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2003/12/01
Vol. E86-C  No. 12  pp. 2452-2461
Type of Manuscript:  Special Section PAPER (Special Issue on Recent Trends on Microwave and Millimeter Wave Application Technology)
Category: Amplifier
Keyword: 
GaAsHEMTflip-chip interconnectioncurrent pathinverted microstrip line
 Summary | Full Text:PDF

A 15-50 GHz-Band GaAs MMIC Variable Attenuator with 20-dB Attenuation Control
Kazuya NISHIHORI Shigeru WATANABE Fumio SASAKI Kazuhiro ARAI 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2001/10/01
Vol. E84-C  No. 10  pp. 1543-1547
Type of Manuscript:  Special Section PAPER (Special Issue on Millimeter-Wave Circuits and Fabrication Technologies Opening up the 21st Century)
Category: 
Keyword: 
microwave and millimeter-wavevariable attenuatorGaAs MMICHEMTbalanced distributed configuration
 Summary | Full Text:PDF

A Compact 40 GHz MMIC Power Amplifier with Improved Power Stage Design
Yasushi SHIZUKI Ken ONODERA Fumio SASAKI Kazuhiro ARAI Hiroyuki YOSHINAGA Juichi OZAKI 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2001/10/01
Vol. E84-C  No. 10  pp. 1535-1542
Type of Manuscript:  Special Section PAPER (Special Issue on Millimeter-Wave Circuits and Fabrication Technologies Opening up the 21st Century)
Category: 
Keyword: 
MMICpower amplifierHEMTmillimeter wavedevice modeling
 Summary | Full Text:PDF

A K-Band MMIC Frequency Doubler Using Resistive Series Feedback Circuit
Yasushi SHIZUKI Yumi FUCHIDA Fumio SASAKI Kazuhiro ARAI Shigeru WATANABE 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2000/05/25
Vol. E83-C  No. 5  pp. 759-766
Type of Manuscript:  PAPER
Category: Microwaves, Millimeter-Waves
Keyword: 
frequency doublerlow spuriousresistive series feedbackMMIC
 Summary | Full Text:PDF

Reliability of Low-Noise HEMTs under Gamma-Ray Irradiation
Yasunobu SAITO Fumio SASAKI Hisao KAWASAKI Hiroshi ISHIMURA Hirokuni TOKUDA Motoharu OHTOMO 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1993/09/25
Vol. E76-C  No. 9  pp. 1379-1383
Type of Manuscript:  Special Section PAPER (Special Issue on Heterostructure Electron Devices)
Category: 
Keyword: 
reliabilityHEMTγ-raydegradation
 Summary | Full Text:PDF