Fumihiko TODA


Comparisons of SiN Passivation Film Deposited by PE-CVD and T-CVD Method for AlGaN/GaN HEMTs on SiC Substrate
Hideyuki OKITA Toshiharu MARUI Shinichi HOSHI Masanori ITOH Fumihiko TODA Yoshiaki MORINO Isao TAMAI Yoshiaki SANO Shohei SEKI 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2009/05/01
Vol. E92-C  No. 5  pp. 686-690
Type of Manuscript:  Special Section PAPER (Special Section on Fundamentals and Applications of Advanced Semiconductor Devices)
Category: 
Keyword: 
AlGaN/GaN HEMTscurrent collapseSiNpassivation filmthermal CVD
 Summary | Full Text:PDF

Effects of a Thermal CVD SiN Passivation Film on AlGaN/GaN HEMTs
Toshiharu MARUI Shinich HOSHI Masanori ITOH Isao TAMAI Fumihiko TODA Hideyuki OKITA Yoshiaki SANO Shohei SEKI 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2008/07/01
Vol. E91-C  No. 7  pp. 1009-1014
Type of Manuscript:  Special Section PAPER (Special Section on Heterostructure Microelectronics with TWHM 2007)
Category: GaN Process Technology
Keyword: 
AlGaN/GaN HEMTsthermal CVD SiNcurrent collapsepassivation filmgate insulator
 Summary | Full Text:PDF

Formation of (Ba, Rb) BiO3 Thin Films by Molecular Beam Epitaxy Using Distilled Ozone
Mitsuhiko OGIHARA Fumihiko TODA Takehiko MAKITA Hitoshi ABE 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1993/08/25
Vol. E76-C  No. 8  pp. 1251-1260
Type of Manuscript:  Special Section PAPER (Special Issue on High-Temperature Superconducting Electronics)
Category: 
Keyword: 
(Rb,Ba)BiO3MBEgrowth processBRBO/STO(Nb)
 Summary | Full Text:PDF

Formation of Au Electrodes on 80K-Phase Bi-Sr-Ca-Cu-O Single Crystal Surfaces and Their Characteristics by XPS
Satoru KISHIDA Heizo TOKUTAKA Makoto CHIHAYA Wataru FUTO Fumihiko TODA Katsumi NISHIMORI Naganori ISHIHARA 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1991/07/25
Vol. E74-C  No. 7  pp. 1967-1971
Type of Manuscript:  Special Section PAPER (Special Issue on Low Temperature Electronics)
Category: 
Keyword: 
 Summary | Full Text:PDF