Eunjung OH


High-Level Test Generation for Asynchronous Circuits from Signal Transition Graph
Eunjung OH Soo-Hyun KIM Dong-Ik LEE Ho-Yong CHOI 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2002/12/01
Vol. E85-A  No. 12  pp. 2674-2683
Type of Manuscript:  Special Section PAPER (Special Section on VLSI Design and CAD Algorithms)
Category: Test Generation
Keyword: 
asynchronous circuitsATPGSTG
 Summary | Full Text:PDF(831.5KB)

Test Generation for SI Asynchronous Circuits with Undetectable Faults from Signal Transition Graph Specification
Eunjung OH Jeong-Gun LEE Dong-Ik LEE Ho-Yong CHOI 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2001/06/01
Vol. E84-A  No. 6  pp. 1506-1514
Type of Manuscript:  Special Section PAPER (Special Section on Papers Selected from 2000 International Technical Conference on Circuits/Systems, Computers and Communications (ITC-CSCC 2000))
Category: 
Keyword: 
ATPGSI asynchronous circuitssignal transition graphtesting
 Summary | Full Text:PDF(777.7KB)