Enrico MACII


Stuck–Open Fault Detection in CMOS Circuits Using Single Test Patterns
Enrico MACII Qing XU 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 1994/11/25
Vol. E77-A  No. 11  pp. 1977-1979
Type of Manuscript:  LETTER
Category: Computer Aided Design (CAD)
Keyword: 
CMOS circuitstuck–open faulttest generation
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