Eiri TAKEDA


Flexible Test Scheduling for an Asynchronous On-Chip Interconnect through Special Data Transfer
Tsuyoshi IWAGAKI Eiri TAKEDA Mineo KANEKO 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2011/12/01
Vol. E94-A  No. 12  pp. 2563-2570
Type of Manuscript:  Special Section PAPER (Special Section on VLSI Design and CAD Algorithms)
Category: Logic Synthesis, Test and Verification
Keyword: 
asynchronous on-chip interconnectCHAINstuck-at faulttest schedulinginteger linear programming
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