Edward J. McCLUSKEY


Design of Autonomous TPG Circuits for Use in Two-Pattern Testing
Kiyoshi FURUYA Seiji SEKI Edward J. McCLUSKEY 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 1995/07/25
Vol. E78-D  No. 7  pp. 882-888
Type of Manuscript:  Special Section PAPER (Special Issue on Verification, Test and Diagnosis of VLSI Systems)
Category: 
Keyword: 
built-in self-test (BIST)two-pattern testpseudorandom pattern generatorautonomous linear sequential circuittransition coverage
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Two-Pattern Test Capabilities of Autonomous TGP Circuits
Kiyoshi FURUYA Edward J. McCLUSKEY 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 1993/07/25
Vol. E76-D  No. 7  pp. 800-808
Type of Manuscript:  Special Section PAPER (Special Issue on VLSI Testing and Testable Design)
Category: 
Keyword: 
two-pattern testingbuilt-in self-testTPG circuitlinear sequential circuittransition coverage
 Summary | Full Text:PDF

A Method and the Effect of Shuffling Compactor Inputs in VLSI Self-Testing
Kiyoshi FURUYA Edward J. McCLUSKEY 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 1992/11/25
Vol. E75-D  No. 6  pp. 842-846
Type of Manuscript:  Special Section PAPER (Special Issue on Pacific Rim International Symposium on Fault Tolerant Systems)
Category: 
Keyword: 
built-in self-testing (BIST)spot errorsignature analysisaliasingshuffling
 Summary | Full Text:PDF