Dandan SHEN


Reseeding-Oriented Test Power Reduction for Linear-Decompression-Based Test Compression Architectures
Tian CHEN Dandan SHEN Xin YI Huaguo LIANG Xiaoqing WEN Wei WANG 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2016/11/01
Vol. E99-D  No. 11  pp. 2672-2681
Type of Manuscript:  PAPER
Category: Computer System
Keyword: 
low power testdata compressionLFSRX-filling
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