Daisuke FUJIMOTO


Fundamental Study on the Effects of Connector Torque Value on the Change of Inductance at the Contact Boundary
Daisuke FUJIMOTO Takashi NARIMATSU Yu-ichi HAYASHI 
Publication:   
Publication Date: 2019/09/01
Vol. E102-C  No. 9  pp. 636-640
Type of Manuscript:  Special Section PAPER (Special Section on Recent Development of Electro-Mechanical Devices)
Category: 
Keyword: 
contact failure of connectorEMITDR
 Summary | Full Text:PDF(1.2MB)

Power Noise Measurements of Cryptographic VLSI Circuits Regarding Side-Channel Information Leakage
Daisuke FUJIMOTO Noriyuki MIURA Makoto NAGATA Yuichi HAYASHI Naofumi HOMMA Takafumi AOKI Yohei HORI Toshihiro KATASHITA Kazuo SAKIYAMA Thanh-Ha LE Julien BRINGER Pirouz BAZARGAN-SABET Shivam BHASIN Jean-Luc DANGER 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2014/04/01
Vol. E97-C  No. 4  pp. 272-279
Type of Manuscript:  Special Section PAPER (Special Section on Solid-State Circuit Design,---,Architecture, Circuit, Device and Design Methodology)
Category: 
Keyword: 
information leakageside-channel attackcorrelation power analysisadvance encryption standard
 Summary | Full Text:PDF(4MB)

A Fast Power Current Simulation of Cryptographic VLSI Circuits for Side Channel Attack Evaluation
Daisuke FUJIMOTO Toshihiro KATASHITA Akihiko SASAKI Yohei HORI Akashi SATOH Makoto NAGATA 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2013/12/01
Vol. E96-A  No. 12  pp. 2533-2541
Type of Manuscript:  Special Section PAPER (Special Section on VLSI Design and CAD Algorithms)
Category: Device and Circuit Modeling and Analysis
Keyword: 
power supply currentelectromagnetic leakageinformation leakageAES
 Summary | Full Text:PDF(2.9MB)

An Arbitrary Digital Power Noise Generator Using 65 nm CMOS Technology
Tetsuro MATSUNO Daisuke FUJIMOTO Daisuke KOSAKA Naoyuki HAMANISHI Ken TANABE Masazumi SHIOCHI Makoto NAGATA 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2010/06/01
Vol. E93-C  No. 6  pp. 820-826
Type of Manuscript:  Special Section PAPER (Special Section on Analog Circuits and Related SoC Integration Technologies)
Category: 
Keyword: 
noise emulationsubstrate noisepower supply noisesignal integritysubstrate couplingpower integrity
 Summary | Full Text:PDF(2.7MB)