Charles R. LUTZ

Reliability of InGaP and AlGaAs HBT
Noren PAN Roger E. WELSER Kevin S. STEVENS Charles R. LUTZ 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2001/10/01
Vol. E84-C  No. 10  pp. 1366-1372
Type of Manuscript:  INVITED PAPER (Joint Special Issue on Heterostructure Microelectronics with TWHM 2000 (Topical Workshop on Heterostructure Microelectronics 2000))
Category: III-V HBTs
HBTMOCVDreliabilitymicrowave devices
 Summary | Full Text:PDF(380.2KB)

Reliability of AlGaAs and InGaP Heterojunction Bipolar Transistors
Noren PAN Roger E. WELSER Charles R. LUTZ James ELLIOT Jesse P. RODRIGUES 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1999/11/25
Vol. E82-C  No. 11  pp. 1886-1894
Type of Manuscript:  INVITED PAPER (Special Issue on High-Frequency/High-Speed Devices for Information and Communication Systems in the 21st Century)
Category: RF Power Devices
HBTInGaP/GaAs HBTsAlGaAs/GaAs HBTsMOCVDreliabilitymicrowave devices
 Summary | Full Text:PDF(725.8KB)