Publication: IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2010/07/01
Vol. E93-A
No. 7
pp. 1309-1318
Type of Manuscript:
PAPER
Category: VLSI Design Technology and CAD
Keyword:
at-speed scan testing, test generation, X-bit identification, X-filling, capture-safety checking, |
