IEICE Trans

Alfred KIK

Electromagnetic Scattering by a Cylindrical Material Piercing through the Narrow Walls of a Rectangular Waveguide: Analytical Solution and Application to Material Characterization Alfred KIK Atsuhiro NISHIKATA
Publication: IEICE TRANSACTIONS on Electronics Publication Date: 2016/01/01 Vol. E99-C No. 1 pp. 52-60 Type of Manuscript: Special Section PAPER (Special Section on Recent Progress in Electromagnetic Theory and Its Application) Category: Keyword: permittivity measurement, permeability measurement, rectangular waveguides, cylinders, inverse scattering, electromagnetic analysis,
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Analytical Solution for the Scattering by a Cylinder Perpendicular to the Narrow Walls inside a Rectangular Waveguide and Its Application to ε_r and μ_r Measurement Alfred KIK Atsuhiro NISHIKATA
Publication: IEICE TRANSACTIONS on Electronics Publication Date: 2012/07/01 Vol. E95-C No. 7 pp. 1211-1221 Type of Manuscript: Special Section PAPER (Special Section on Recent Trends of Microwave Systems and Their Fundamental Technologies) Category: Keyword: permittivity measurement, permeability measurement, rectangular waveguides, cylinders, scattering, electromagnetic analysis,
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A New Calibration Algorithm Using Reference Materials for the Waveguide-Penetration Method Alfred KIK Atsuhiro NISHIKATA
Publication: IEICE TRANSACTIONS on Communications Publication Date: 2011/09/01 Vol. E94-B No. 9 pp. 2549-2557 Type of Manuscript: PAPER Category: Electromagnetic Compatibility(EMC) Keyword: permittivity measurement, permeability measurement, waveguide, transmission-line method, vector network analyzer (VNA), calibration algorithm, reference material, error analysis,
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Analysis of Errors in Permittivity Measurements Using the Waveguide-Penetration Method Alfred KIK Atsuhiro NISHIKATA
Publication: IEICE TRANSACTIONS on Communications Publication Date: 2010/07/01 Vol. E93-B No. 7 pp. 1697-1706 Type of Manuscript: Special Section PAPER (Special Section on Advanced Electromagnetic Compatibility Technology in Conjunction with Main Topics of EMC'09/Kyoto) Category: EMC Measurement Technique, EMC Test Facilities Keyword: permittivity measurement, waveguide method, measurement errors, error analysis,
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