Akira TAKETANI


Test Pattern Ordering and Selection for High Quality Test Set under Constraints
Michiko INOUE Akira TAKETANI Tomokazu YONEDA Hideo FUJIWARA 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2012/12/01
Vol. E95-D  No. 12  pp. 3001-3009
Type of Manuscript:  PAPER
Category: Dependable Computing
Keyword: 
small delay defectsSDQLATPG
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