Akira NAKAYAMA

Complex Permittivity Measurement at Pseudo Microwave Frequency Using a Dielectric-Plate-Loaded Cavity Resonator
Akira NAKAYAMA Atsuomi FUKUURA Michiaki NISHIMURA 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1997/08/25
Vol. E80-C  No. 8  pp. 1117-1125
Type of Manuscript:  PAPER
Category: Microwave and Millimeter Wave Technology
Keyword: 
permittivity measurement, pseudo microwave, cavity resonator, dielectric substrate, 
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A Measurement Method of Complex Permittivity at Pseudo Microwave Frequencies Using a Cavity Resonator Filled with Dielectric Material
Akira NAKAYAMA 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1994/06/25
Vol. E77-C  No. 6  pp. 894-899
Type of Manuscript:  Special Section PAPER (Special Issue on Measurement Techniques for Microwave/Millimeter Wave)
Category: 
Keyword: 
measurement of complex permittivity, cavity resonator, pseudo microwave frequency, dielectric substrate, sapphire (Al2O3), alumina (Al2O3), mullite (3Al2O3・2SiO2), 
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An Improved Reflection Wave Method for Measurement of Complex Permittivity at 100 MHz-1GHz
Akira NAKAYAMA Kazuya SHIMIZU 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1994/04/25
Vol. E77-C  No. 4  pp. 633-638
Type of Manuscript:  PAPER
Category: Microwave and Millimeter Wave Technology
Keyword: 
measurement of complex permittivity, reflection wave method, MHz-GHz range, frequency dependence, 
 Summary | Full Text:PDF
Facial Caricaturing Based on Visual Illusion--A Mechanism to Evaluate Caricature in PICASSO System--
Kazuhito MURAKAMI Hiroyasu KOSHIMIZU Akira NAKAYAMA Teruo FUKUMURA 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 1993/04/25
Vol. E76-D  No. 4  pp. 470-478
Type of Manuscript:  Special Section PAPER (Special Issue on Image Processing and Understanding)
Category: 
Keyword: 
facial caricature, deformation, personal feature extraction, visual illusion, in-betweening method, cognitive vision, 
 Summary | Full Text:PDF