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Copyright (c) by IEICE
Akira HEYA
Low-Temperature Activation in Boron Ion-Implanted Silicon by Soft X-Ray Irradiation
Akira HEYA
Naoto MATSUO
Kazuhiro KANDA
Publication:
IEICE TRANSACTIONS on Electronics
Publication Date:
2016/04/01
Vol.
E99-C
No.
4
pp.
474-480
Type of Manuscript:
PAPER
Category:
Semiconductor Materials and Devices
Keyword:
boron dopant
,
low-temperature activation
,
soft X-ray irradiation
,
sheet resistance
,
electron excitation
,
depth profile
,
Summary
|
Full Text:PDF
(805.2KB)
Improvement of Hump Phenomenon of Thin-Film Transistor by SiN
X
Film
Takahiro KOBAYASHI
Naoto MATSUO
Akira HEYA
Shin YOKOYAMA
Publication:
IEICE TRANSACTIONS on Electronics
Publication Date:
2014/11/01
Vol.
E97-C
No.
11
pp.
1112-1116
Type of Manuscript:
PAPER
Category:
Semiconductor Materials and Devices
Keyword:
TFT
,
SiN
X
film
,
fixed charge
,
hump phenomenon
,
Summary
|
Full Text:PDF
(1.3MB)
Properties of SiO
2
Surface and Pentacene OTFT Subjected to Atomic Hydrogen Annealing
Akira HEYA
Naoto MATSUO
Publication:
IEICE TRANSACTIONS on Electronics
Publication Date:
2010/10/01
Vol.
E93-C
No.
10
pp.
1516-1517
Type of Manuscript:
BRIEF PAPER
Category:
Keyword:
pentacene
,
organic thin-film transistors
,
atomic hydrogen annealing
,
crystal orientation
,
carrier mobility
,
Summary
|
Full Text:PDF
(257.7KB)