Akinobu TERAMOTO


Data Analysis Technique of Atomic Force Microscopy for Atomically Flat Silicon Surfaces
Masahiro KONDA Akinobu TERAMOTO Tomoyuki SUWA Rihito KURODA Tadahiro OHMI 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2009/05/01
Vol. E92-C  No. 5  pp. 664-670
Type of Manuscript:  Special Section PAPER (Special Section on Fundamentals and Applications of Advanced Semiconductor Devices)
Category: 
Keyword: 
atomically flat silicon surfacesoff angleatomic force microscopy
 Summary | Full Text:PDF(1.9MB)

Characterization of Extrinsic Oxide Breakdown on Thin Dielectric Oxide
Katsuya SHIGA Junko KOMORI Masafumi KATSUMATA Akinobu TERAMOTO Yoji MASHIKO 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1999/04/25
Vol. E82-C  No. 4  pp. 589-592
Type of Manuscript:  Special Section PAPER (Special Issue on Microelectronic Test Structures)
Category: 
Keyword: 
oxide reliabilityextrinsic oxide breakdownTDDBthin oxideactivation energy
 Summary | Full Text:PDF(484.2KB)