Abderrahim DOUMAR


Defect and Fault Tolerance SRAM-Based FPGAs by Shifting the Configuration Data
Abderrahim DOUMAR Hideo ITO 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2000/05/25
Vol. E83-D  No. 5  pp. 1104-1115
Type of Manuscript:  PAPER
Category: Fault Tolerance
Keyword: 
defect tolerancefault tolerancefield programmable gate array (FPGA)shifting configurations datayield improvement
 Summary | Full Text:PDF(779.1KB)

Fast Testable Design for SRAM-Based FPGAs
Abderrahim DOUMAR Toshiaki OHMAMEUDA Hideo ITO 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2000/05/25
Vol. E83-D  No. 5  pp. 1116-1127
Type of Manuscript:  PAPER
Category: Fault Tolerance
Keyword: 
field programmable gate array (FPGA)testingdesign for testingshifting configurations
 Summary | Full Text:PDF(1.3MB)