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Vol/No/Title/Authors number Price(including tax)
Vol.E101-D No.8
A Design for Testability of Open Defects at Interconnects in 3D Stacked ICs
Fara ASHIKIN, Masaki HASHIZUME, Hiroyuki YOTSUYANAGI, Shyue-Kung LU, Zvi ROTH,
1 ¥3240
Total: ¥3,240