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Vol/No/Title/Authors number Price(including tax)
Vol.E101-C No.4
Reliability Analysis of Scaled NAND Flash Memory Based SSDs with Real Workload Characteristics by Using Real Usage-Based Precise Reliability Test
Yusuke YAMAGA, Chihiro MATSUI, Yukiya SAKAKI, Ken TAKEUCHI,
1 ¥3240
Total: ¥3,240