A Fully-Connected Ising Model Embedding Method and Its Evaluation for CMOS Annealing Machines

Daisuke OKU  Kotaro TERADA  Masato HAYASHI  Masanao YAMAOKA  Shu TANAKA  Nozomu TOGAWA  

Publication:   IEICE TRANSACTIONS on Information and Systems
Publicized: 2019/06/10
DOI: 10.1587/transinf.2018EDP7411
Full Text: PDF(431.6KB)